scanning probe microscopy

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Scanning Probe Microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position. SPM was founded with the invention of the scanning tunneling microscope in 1981
scanning probe microscopy

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    scan·ning probe mi·cros·co·py

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    skänîng prōb maykrʌskıpi

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    /ˈskanəɴɢ ˈprōb mīˈkrəskəpē/ /ˈskænɪŋ ˈproʊb maɪˈkrʌskəpiː/