to burn-in

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English - English
The process of exercising an integrated circuit at elevated voltage and temperature This process accelerates failures normally seen as "infant mortality" in a chip (Those chips that would fail early during actual usage will fail during burn-in Those that pass have a life expectancy much greater than that required for normal usage )
A test defined in MIL-STD-883 that involves applying high-voltage electrical tests at high temperatures for long periods to detect and discard parts that would fail before their specified lifespan
A long term screening test (either vibration, temperature or combined test) that is effective in weeding out infant mortalities because it simulates actual or worst case operation of the device, accelerated through a time, power, and temperature relationship
A screening operation subjecting devices to high temperature bias (commonly at 125 degree celcius) for 160 hours (TI*)
The Photographic double exposure of a title or other subject matter over previously exposed film
If the same image is displayed on the monitor for a long period of time a copy of that image can become permanently burnt into the phosphor coating on the back of the glass, meaning that when it is turned off the image can still be seen This is called 'burn-in' and is the reason screen-savers were originally introduced
The process of exercising an integrated circuit at elevated voltage and temperature This process accelerates failure normally seen as "infant mortality" in a chip (Those chips that would fail early during actual usage will fail during burn-in Those that pass have a life expectancy much greater than that required for normal usage )
The process of exercising an integrated circuit at elevated voltage and temperature This process accelerates failure normally seen as “infant mortality” in a chip (Those chips that would fail early during actual usage will fail during burn-in Those that pass have a life expectancy much greater than that required for normal usage )
A screening operation subjecting devices to high temperature bias (commonly at 125 degree celcius) for 160 hours
Burn-Inis a term that is generally used to describe a test, or continuous operation, of a component, assembly, or system before it is put to use During a burn-In test, the component, assembly, or system is typically subjected to an elevated temperature and its operating electrical conditions Stabilization, defect detection, or inducing early-life failures are the objectives of a burn-in test or operation
The operation of newly manufactured power converters for a period of time prior to shipment The intent is to stabilize the converter and eliminate infant mortality by aging the device The time period and conditions (input power cycling, load switching, temperature, etc ) will vary from vendor to vendor However, the less stringent the conditions, the less likely it is that potential problems will be caught by the vendor
Operation of newly manufactured power supplies for some period of time prior to shipment The intent is to stabilize the power supply and eliminate infant mortality by aging the device The time period and conditions (input power cycling, load switching, temperature, etc ) varies from vendor-to-vendor However, the less stringent the conditions, the less likely it is that potential problems will be caught by the vendor
The process of electrically stressing a device (usually at high temperature and voltage) for a period of time long enough to cause failure of marginal electronics devices
The process of operating devices or equipment often under accelerated voltage, temperature, or load in order to screen out infant mortality failures
Continuously powering a product, often at constant elevated temperature, in order to accelerate the aging process Much less effective, in my opinion, than power-on ramping of temperature + random vibration
A process where a device or assembly is subjected to electrical or physical stress to simulate actual or accelerated use It is designed to verify the function of the device under test and also to weed out any possible devices with latent defects Go back to the MENU Go to END
The process in which a device is electrically stressed by subjecting it to an elevated temperature and voltage for an adequate period of time to cause the failure of a marginal device